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Secondary Ion Mass Spectrometry

Secondary Ion Mass Spectrometry Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X), University of Muenster, Muenster, Germany

Hardback (25 Feb 1997)

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Publisher's Synopsis

This text provides an excellent overview of current research and technology by acknowledged experts in their specialist fields.

Book information

ISBN: 9780471958970
Publisher: Wiley
Imprint: Wiley Blackwell
Pub date:
DEWEY: 543.0873
DEWEY edition: 21
Number of pages: 1084
Weight: 1640g
Height: 236mm
Width: 157mm
Spine width: 68mm