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Secondary Ion Mass Spectrometry SIMS II

Secondary Ion Mass Spectrometry SIMS II Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 - Springer Series in Chemical Physics

Hardback (03 Mar 1980) | German

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Book information

ISBN: 9783540098430
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
DEWEY: 543.65
Language: German
Number of pages: 300 .
Weight: 745g