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Scanning Tunneling Microscopy/spectroscopy and Related Techniques

Scanning Tunneling Microscopy/spectroscopy and Related Techniques 12th International Conference, Eindhoven, the Netherlands - AIP Conference Proceedings

2003

Paperback (19 Dec 2003)

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Publisher's Synopsis

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed.

Book information

ISBN: 9780735401686
Publisher: American Institute of Physics
Imprint: American Institute of Physics
Pub date:
Edition: 2003
DEWEY: 502.825
DEWEY edition: 22
Language: English
Number of pages: 179
Weight: 540g
Height: 234mm
Width: 162mm
Spine width: 19mm