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Scanning Tunneling Microscopy and Its Application

Scanning Tunneling Microscopy and Its Application - Springer Series in Surface Sciences

2nd Revised Edition

Hardback (10 Aug 2000)

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Publisher's Synopsis

Scanning Tunneling Microscopy and its Application presents a unified view of the rapidly growing field of STM,and its many derivatives. A thorough discussion of the various principles provides the background to tunneling phenomena and leads to the many novel scanning-probe techniques, such as AFM, MFM, BEEM, PSTM, etc. After having examined the available instrumentation and the methods for tip and surface preparations, the monograph provides detailed accounts of STM application to metal and semiconductor surfaces, adsorbates and surface chemistry, biology, and nanofabrication. It examines limitations of the present-day investigations and provides hints about possible further trends. This second edition includes important new developments in the field.

Book information

ISBN: 9783540657156
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2nd Revised Edition
DEWEY: 502.82
DEWEY edition: 21
Language: English
Number of pages: 368
Weight: 1600g
Height: 234mm
Width: 156mm
Spine width: 22mm