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Scanning Probe Microscopy

Scanning Probe Microscopy Atomic Force Microscopy and Scanning Tunneling Microscopy - NanoScience and Technology

Softcover reprint of the original 1st Edition 2015

Paperback (13 Oct 2016)

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Publisher's Synopsis

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Book information

ISBN: 9783662505571
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: Softcover reprint of the original 1st Edition 2015
Language: English
Number of pages: 382
Weight: 6029g
Height: 235mm
Width: 155mm
Spine width: 21mm