Paperback (15 Jul 1987)
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Provides a practical introduction to the use of scanning electron microscopy (SEM). Covers sample preparation, instrumentation and the more complex area of SEM-X-Ray Microanalysis. Mathematics are kept to a minimum with the emphasis on developing an understanding of the practical aspects of the techniques. The use of self-assessment questions to reinforce the learning process is particularly valuable.
| ISBN: | 9780471913917 |
| Publisher: | Published on behalf of ACOL by Wiley |
| Imprint: | Wiley Blackwell |
| Pub date: | 15 Jul 1987 |
| DEWEY: | 502.825 |
| DEWEY edition: | 19 |
| Language: | English |
| Number of pages: | 122 |
| Weight: | 200g |
| Height: | 240mm |
| Width: | 160mm |
| Spine width: | 8mm |
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