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Rough Surface Scattering and Contamination

Rough Surface Scattering and Contamination 21-23 July 1999, Denver, Colorado - SPIE Proceedings Series

Paperback (31 Oct 1999)

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Book information

ISBN: 9780819432704
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 620.44
DEWEY edition: 21
Language: English
Number of pages: 404
Weight: 929g
Height: 280mm
Width: 209mm
Spine width: 19mm