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Resonant X-Ray Scattering in Correlated Systems

Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics

Hardback (05 Jan 2017)

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Publisher's Synopsis

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Book information

ISBN: 9783662532256
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
DEWEY: 539.7222
DEWEY edition: 23
Language: English
Number of pages: 241
Weight: 5029g
Height: 235mm
Width: 155mm
Spine width: 16mm