2011
Hardback (21 Oct 2010)
Save $18.23
Includes delivery to the United States
10+ copies available online - Usually dispatched within 7 days
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques. Additionally, the book provides an in depth state-of-the-art research results and methods for fault tolerance as well as the methodology for designing fault-tolerant systems out of highly unreliable components.
| ISBN: | 9781441962164 |
| Publisher: | Springer New York |
| Imprint: | Springer |
| Pub date: | 21 Oct 2010 |
| Edition: | 2011 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 22 |
| Language: | English |
| Number of pages: | 195 |
| Weight: | 506g |
| Height: | 235mm |
| Width: | 155mm |
| Spine width: | 18mm |
$3.10off
A Dictionary of Electronics and...
Paperback
Published 21 Jun 2018
Save $3.10
$7.32off
Electronics
Paperback
Published 08 Oct 2021
Save $7.32
$0.41off
50 AI Ideas You Really Need to ...
Paperback
Published 12 Sep 2024
Save $0.41
The Official Raspberry Pi Handb...
Paperback
Published 26 Sep 2024
$3.17off
Artificial Intelligence
Paperback
Published 26 Sep 2024
Save $3.17
$9.27off
Modern Assembly Language Progra...
Paperback
Published 07 Oct 2024
Save $9.27
Book of Making 2025
Paperback
Published 10 Oct 2024
$24.57off
Pattern Recognition
Paperback
Published 01 Apr 2024
Save $24.57
$58.26off
Verifiable Autonomous Systems
Hardback
Published 08 Jun 2023
Save $58.26