Publisher's Synopsis
This book presents information, procedures, tests and illustrations to help engineers analyze time-to-failure data to ensure greater reliability in the products they design. It offers essential information on a variety of distributions including Chi-square, Exponential, Normal, Lognormal, Weibull, Gamma and others. A reference for reliability, product assurance and test engineers, the guide also provides a step-by-step method for goodness-of-fit analysis, sudden death testing and other techniques. This is the first in a two-volume series.
