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Reliability and Degradation of III-V Optical Devices

Reliability and Degradation of III-V Optical Devices

Hardback (01 Oct 1996)

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Publisher's Synopsis

Focusing on helping researchers and engineers involved in III-V compound semiconductor thin film growth and processing, this text shows the mechanism of degradation, detailing the major degradation modes of optical devices fabricated from three different systems, and describing methods for elimination of defect-generating mechanisms.

Book information

ISBN: 9780890066522
Publisher: Artech House
Imprint: Artech House
Pub date:
DEWEY: 621.36
DEWEY edition: 20
Language: English
Number of pages: 353
Weight: 698g
Height: 234mm
Width: 156mm
Spine width: 22mm