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Reliability and Degradation

Reliability and Degradation Semiconductor Devices and Circuits - The Wiley Series in Solid State Devices and Circuits

Hardback (25 Nov 1981)

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Book information

ISBN: 9780471280286
Publisher: Wiley
Imprint: Wiley Blackwell
Pub date:
DEWEY: 621.38152
DEWEY edition: 18
Language: English
Number of pages: 444
Weight: 750g
Height: 240mm
Width: 160mm