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Reliability, Testing, and Characterization of MEMS/MOEMS II

Reliability, Testing, and Characterization of MEMS/MOEMS II 27-29 January 2003, San Jose, California, USA - SPIE Proceedings Series

Paperback (31 Jan 2003)

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Book information

ISBN: 9780819447807
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.381
DEWEY edition: 22
Language: English
Number of pages: 334
Weight: 879g
Height: 279mm
Width: 209mm
Spine width: 25mm