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Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Hardback (07 Jan 2022)

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Publisher's Synopsis

This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.

Book information

ISBN: 9781839682292
Publisher: IntechOpen
Imprint: IntechOpen
Pub date:
DEWEY: 502.82
DEWEY edition: 23
Language: English
Number of pages: 274
Weight: 640g
Height: 260mm
Width: 180mm
Spine width: 18mm