Book (31 Aug 1995)
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An overview of current SiC research, which covers basic physical properties, optical properties, spectroscopic characterization, defects, the diffusion of impurities, etching, selective doping and crystal growth, microstructure, electronic properties and SiC-based devices.
| ISBN: | 9780852968703 |
| Publisher: | INSPEC |
| Imprint: | INSPEC |
| Pub date: | 31 Aug 1995 |
| DEWEY: | 537.622 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 282 |
| Weight: | -1g |
| Height: | 234mm |
| Width: | 156mm |
| Spine width: | 31mm |
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