Book (15 Aug 1996)
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This volume describes the results of current research on the characterization and precisely-controlled building of atomic-scale multilayers of semiconductors. It should enable engineers to achieve great improvements in the performance of microelectronic and optoelectronic devices.
| ISBN: | 9780852968819 |
| Publisher: | INSPEC |
| Imprint: | INSPEC |
| Pub date: | 15 Aug 1996 |
| DEWEY: | 537.622 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 400 |
| Weight: | 1519g |
| Height: | 280mm |
| Width: | 210mm |
| Spine width: | 38mm |
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