Microelectronic Circuits
Paperback
Published 27 Jan 2020
- $205.91
Process Module Metrology, Control, and Clustering 11-13 September 1991, San Jose, California - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (01 Jan 1992)
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Book information
| ISBN: | 9780819407252 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 01 Jan 1992 |
| DEWEY: | 621.381 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 419 |
| Weight: | -1g |
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