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Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects

Proceedings of the Symposium on the Degradation of Electronic Devices Due to Device Operation as Well as Crystalline and Process-Induced Defects - Proceedings

Book (01 Jan 1994)

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Book information

ISBN: 9781566770378
Publisher: Electrochemical Society
Imprint: Electrochemical Society
Pub date:
DEWEY: 621.38152
DEWEY edition: 20
Language: English
Number of pages: 319
Weight: 453g
Height: 234mm
Width: 158mm
Spine width: 19mm