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Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

Book (31 Jul 2002)

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    Publisher's Synopsis

    This text contains information on designing and testing computer hardware as presented at the 2002 IEEE International Memory Technology, Design and Testing (MTDT 2002).

    Book information

    ISBN: 9780769516172
    Publisher: IEEE Computer Society
    Imprint: IEEE Computer Society
    Pub date:
    DEWEY: 621.39732
    DEWEY edition: 22
    Language: English
    Number of pages: 182
    Weight: -1g
    Height: 279mm
    Width: 216mm
    Spine width: 12mm

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