Book (30 Sep 2001)
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This volume contains the conference proceedings of the 2001 8th International Symposium on the Physical and Failure Analysis of Integrated Circuits.
| ISBN: | 9780780366756 |
| Publisher: | Institute of Electrical and Electronics Engineers |
| Imprint: | Institute of Electrical and Electronics Engineers |
| Pub date: | 30 Sep 2001 |
| DEWEY: | 621.3815 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 262 |
| Weight: | -1g |
| Height: | 230mm |
| Width: | 203mm |
| Spine width: | 12mm |
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