Skip your Account's links

$ USD

Advanced search

0 items

$0.00
  • Your basket
  • The RRP is the suggested or Recommended Retail Price of a product, set by the publisher or manufacturer.

  • View basket

  • Your basket is empty

  • Delivery included on your order!

  • View basket

Skip Navigation and go to main content

Delivery included to the United States

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits [IPFA '99 5-9 July, 1999, Orchard Hotel, Singapore]

Hardback (30 Sep 1999)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Check stock

    Publisher's Synopsis

    Aimed at integrated circuit designers, solid state component designers and packaging and manufacturing engineers, these proceedings cover such subjects as: failure analysis technologies; process and device; packaging and metallization; dielectrics; and reliability of specialist devices.

    Book information

    ISBN: 9780780351875
    Publisher: IEEE
    Imprint: IEEE
    Pub date:
    DEWEY: 621.3815
    DEWEY edition: 22
    Language: English
    Number of pages: 209
    Weight: -1g
    Height: 292mm
    Width: 209mm
    Spine width: 12mm

    We recommend

    $3.80off

    Add to basket

    $7.77off

    Electronics

    Charles Platt

    Paperback
    Published 08 Oct 2021

    Save $7.77

    • RRP $38.85
    • $31.08
    Add to basket

    $8.89off

    Add to basket
    Add to basket
    Add to basket

    $3.22off

    Add to basket

    $9.41off

    Add to basket
    Add to basket

    $59.14off

    Add to basket