Delivery included to the United States

Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2004 : [July 5-8, 2004, Taiwan]

Book (01 Jan 2004)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780780384545
Publisher: IEEE
Imprint: IEEE
Pub date:
DEWEY: 621.3815
DEWEY edition: 22
Language: English
Number of pages: 326