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Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits

Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits IPFA 2003 : [Scheduled, 7 to 11 July, 2003, Singapore]

Book (30 Sep 2003)

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    Publisher's Synopsis

    This text covers topics on: advanced failure analysis techniques; advanced interconnects; dielectrics and hot-carrier reliabilty; EOS/ESD and CMOS latchup; practical issues in building-in reliability; and reliability and failure analysis in specialist devices.

    Book information

    ISBN: 9780780377226
    Publisher: IEEE
    Imprint: IEEE
    Pub date:
    DEWEY: 621.3815
    DEWEY edition: 22
    Language: English
    Weight: -1g

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    Make: Radio

    Charles Platt, Fredr...

    Paperback
    Published 14 Jun 2024

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    • RRP $33.30
    • $29.05
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