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Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)

Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99) Pergamon

CD-ROM (17 Dec 1999)

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Book information

ISBN: 9780080434216
Publisher: Pergamon
Imprint: Pergamon
Pub date:
Number of pages: 492
Weight: -1g
Height: 273mm
Width: 203mm
Spine width: 25mm