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Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)

Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (Esref'99)

Hardback (17 Dec 1999)

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Publisher's Synopsis

Papers from an October 1999 symposium present recent developments and future trends in the quality and reliability of materials, devices, and circuits for microelectronics, addressing all aspects of specification, technology and manufacturing, test, control, and analysis. Papers are arranged in sections on quality and reliability, modeling of failu

Book information

ISBN: 9780080434193
Publisher: Pergamon
Imprint: Pergamon
Pub date:
Number of pages: 492
Weight: -1g
Height: 254mm
Width: 184mm
Spine width: 12mm