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Power, Thermal, Noise, and Signal Integrity Issues on Substrate/interconnects Entanglement

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/interconnects Entanglement

Hardback (21 Mar 2019)

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Publisher's Synopsis

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.

Book information

ISBN: 9780367023430
Publisher: CRC Press
Imprint: CRC Press
Pub date:
DEWEY: 621.381531
DEWEY edition: 23
Language: English
Number of pages: 226
Weight: 506g
Height: 164mm
Width: 241mm
Spine width: 16mm