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Polarization Analysis and Applications to Device Technology

Polarization Analysis and Applications to Device Technology International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (16 Aug 1996)

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Book information

ISBN: 9780819422712
Publisher: SPIE
Imprint: SPIE
Pub date:
Language: English
Number of pages: 350
Weight: -1g