Biometrics
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Polarimetry and Ellipsometry 20-23 May, 1996, Kazimierz Dolny, Poland - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (01 Apr 1997)
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Book information
| ISBN: | 9780819425096 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 01 Apr 1997 |
| DEWEY: | 681.25 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 374 |
| Weight: | -1g |
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