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Point Defects in Semiconductors and Insulators

Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science

Softcover reprint of the original 1st Edition 2003

Paperback (14 Sep 2012)

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Publisher's Synopsis

Book information

ISBN: 9783642627224
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: Softcover reprint of the original 1st Edition 2003
Language: English
Number of pages: 492
Weight: 771g
Height: 234mm
Width: 156mm
Spine width: 25mm