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Point Defects in Semiconductors and Insulators

Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions - Springer Series in Materials Science

2003

Hardback (22 Jan 2003)

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Publisher's Synopsis

Book information

ISBN: 9783540426950
Publisher: Springer Berlin Heidelberg
Imprint: Springer
Pub date:
Edition: 2003
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 490
Weight: 1950g
Height: 234mm
Width: 156mm
Spine width: 28mm