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Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM

Softcover reprint of hardcover 1st Edition 2005th edition

Paperback (02 Nov 2010)

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Publisher's Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Book information

ISBN: 9781441938374
Publisher: Springer US
Imprint: Springer
Pub date:
Edition: Softcover reprint of hardcover 1st Edition 2005th edition
Language: English
Number of pages: 202
Weight: 310g
Height: 234mm
Width: 156mm
Spine width: 11mm