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Photon Migration, Optical Coherence Tomography, and Microscopy

Photon Migration, Optical Coherence Tomography, and Microscopy 18-21 June 2001, Munich, Germany - Proceedings of SPIE

Book (01 Jan 2001)

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    Book information

    ISBN: 9780819441454
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    DEWEY: 616.0754
    DEWEY edition: 21
    Language: English
    Number of pages: 356
    Weight: -1g

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