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Optoelectronic Measurement Technology and Applications

Optoelectronic Measurement Technology and Applications 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China - Proceedings of SPIE

Paperback (30 Jan 2009)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819474049
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 22
Weight: 1769g
Height: 266mm
Width: 209mm
Spine width: 44mm