Delivery included to the United States

Optical Microlithography and Metrology for Microcircuit Fabrication

Optical Microlithography and Metrology for Microcircuit Fabrication Proceedings, ECO2, 27-28 April, 1989, Paris, France - SPIE Proceedings Series

Book (01 Jan 1989)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780819401748
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.3815
DEWEY edition: 20
Language: English
Number of pages: 206
Weight: -1g