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Optical Metrology

Optical Metrology Proceedings of a Conference Held 18-19 July, 1999, Denver, Colorado - Critical Reviews of Optical Science and Technology

Paperback (31 Jul 1999)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819432353
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 681.25
DEWEY edition: 21
Language: English
Number of pages: 276
Weight: 503g
Height: 255mm
Width: 180mm
Spine width: 16mm