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Optical Measurement Systems for Industrial Inspection IV

Optical Measurement Systems for Industrial Inspection IV 13-17 June 2005, Munich, Germany - Proceedings of SPIE

Paperback (30 Jun 2005)

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Publisher's Synopsis

Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

Book information

ISBN: 9780819458568
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 670.425
DEWEY edition: 22
Language: English
Number of pages: 1048
Weight: 2404g
Height: 266mm
Width: 203mm
Spine width: 50mm