Delivery included to the United States

Optical Characterization Techniques for Semiconductor Technology

Optical Characterization Techniques for Semiconductor Technology April 1-2, 1981, San Jose, California - Proceedings of the Society of Photo-Optical Instrumentation Engineers

Paperback (01 Jan 1981)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780892523092
Publisher: Society of Photo-optical Instrumentation Engineers
Imprint: Society of Photo-optical Instrumentation Engineers
Pub date:
DEWEY: 621.381520287
DEWEY edition: 19
Language: English
Number of pages: 262