Publisher's Synopsis
Radiation technologies, such as ion implantation, ion beam mixing and plating, are considered powerful techniques in the modification of the surface and near-surface properties of solids. Although they hold promise for the future, the successful application of these processes demands knowledge of the effects of radiation in thin surface layers of metals and materials.;This tutorial presentation reviews basic features of rapid nuclear analysis methods, such as Rutherford backscattering and channelling, in conjunction with changes of ion energy, ion-induced X-ray emission and nuclear micro-analysis. It also presents experimental results obtained by the authors both in the USSR and in collaboration with colleagues in laboratories in Canada, the UK, FRG, GDR and Denmark.;Among the aspects studied were the mechanisms of damage and structural transformations in multi-component and multi-layer structures and in ion-irradiated GaAs and Ni single crystals, and the processes of defect interaction in collision cascades.
