Delivery included to the United States

Noise in Devices and Circuits

Noise in Devices and Circuits 2-4 June, 2003, Santa Fe, New Mexico, USA - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (31 May 2003)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780819449733
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.38224
DEWEY edition: 22
Language: English
Number of pages: 516
Weight: -1g