Delivery included to the United States

Noise and Information in Nanoelectronics, Sensors, and Standards

Noise and Information in Nanoelectronics, Sensors, and Standards 2-4 June 2003, Santa Fe, New Mexico, USA - SPIE Proceedings Series

Paperback (31 May 2003)

Not available for sale

Out of stock

This service is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.

Book information

ISBN: 9780819449757
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.38224
DEWEY edition: 22
Language: English
Number of pages: 430
Weight: -1g