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Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium SEMI-THERM Proceedings 2003 : San Jose, CA, USA, March 11-13, 2003

Hardback (01 Jan 2003)

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Book information

ISBN: 9780780377936
Publisher: IEEE
Imprint: IEEE
Pub date:
Language: English
Number of pages: 404