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Morphological and Compositional Evolution of Heteroepitaxial Semiconductor Thin Films

Morphological and Compositional Evolution of Heteroepitaxial Semiconductor Thin Films Symposium Held April 24-27, 2000, San Francisco, California, U.S.A - Materials Research Society Symposium Proceedings

Hardback (18 Oct 2000)

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Publisher's Synopsis

Strain has a tremendous effect on the morphology and composition of heteroepitaxial semiconductor thin films. Recent progress in strained island formation, and in the morphological and compositional instabilities induced by heteroepitaxial stress, has led to new theoretical and experimental advances, as well as to promising materials for various optoelectronic applications. This book brings together research groups looking at important advances and breaking news in the field. The book centers around mechanisms rather than materials, thus papers in different semiconductor systems, including SiGe, III-V, nitrides, or II-VI semiconductors, are presented. Issues on growth, characterization, and modeling of morphological and compositional nonuniformities are also addressed, as are devices based on these spontaneous structures. Topics include: surface dynamics - atomistic processes; growth on patterned, high-index and vicinal substrates; quantum dots and wires; interdiffusion and segregation; band structure, electronic properties and devices; morphology and microstructure; and nitrides

About the Publisher

Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9781558995260
Publisher: Materials Research Society
Imprint: Cambridge University Press
Pub date:
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 333
Weight: 1000g
Height: 234mm
Width: 155mm
Spine width: 23mm