Publisher's Synopsis
A review of the data obtained by microwave spectroscopy, electron and neutron diffraction and X-ray analysis techniques on the various classes of organosilicon compounds, from the mid-1930s (when the first determinations of bond lengths and angles were attempted), to the present day.;Largely based on the card index compiled at the Laboratory of Organoelemental Compounds in the Institute of Organic Synthesis in Riga, areas covered include organosilanes and polysilanes, with emphasis on compounds characterized by the traditional tetrahedral silicon structure and derivatives with double Si=Si bonds.;There is also a survey of data on molecular structure of silicon-containing organometallic and organometalloid compounds and a description of compounds with penta and hexaco-ordinate silicon.
