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Modeling and Characterization of RF and Microwave Power FETs

Modeling and Characterization of RF and Microwave Power FETs - The Cambridge RF and Microwave Engineering Series

Paperback (30 Jun 2011)

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Publisher's Synopsis

This book is a comprehensive exposition of FET modeling, and is a must-have resource for seasoned professionals and new graduates in the RF and microwave power amplifier design and modeling community. In it, you will find descriptions of characterization and measurement techniques, analysis methods, and the simulator implementation, model verification and validation procedures that are needed to produce a transistor model that can be used with confidence by the circuit designer. Written by semiconductor industry professionals with many years' device modeling experience in LDMOS and III-V technologies, this was the first book to address the modeling requirements specific to high-power RF transistors. A technology-independent approach is described, addressing thermal effects, scaling issues, nonlinear modeling, and in-package matching networks. These are illustrated using the current market-leading high-power RF technology, LDMOS, as well as with III-V power devices.

About the Publisher

Cambridge University Press

Cambridge University Press dates from 1534 and is part of the University of Cambridge. We further the University's mission by disseminating knowledge in the pursuit of education, learning and research at the highest international levels of excellence.

Book information

ISBN: 9780521336178
Publisher: Cambridge University Press
Imprint: Cambridge University Press
Pub date:
DEWEY: 621.3815284
DEWEY edition: 23
Language: English
Number of pages: 362
Weight: 634g
Height: 245mm
Width: 171mm
Spine width: 21mm