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Microsystems Engineering

Microsystems Engineering Metrology and Inspection : 20-21 June 2001, Munich, Germany - SPIE Proceedings Series

Paperback (01 Jan 2001)

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    Book information

    ISBN: 9780819440952
    Publisher: SPIE
    Imprint: SPIE
    Pub date:
    DEWEY: 620.0044
    DEWEY edition: 21
    Language: English
    Number of pages: 176
    Weight: -1g

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