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Microscopy of Semiconducting Materials 2003

Microscopy of Semiconducting Materials 2003 Proceedings of the Institute of Physics Conference, Cambridge University, 31 March - 3 April 2003 - Institute of Physics Conference Series

Hardback (20 Apr 2004)

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Publisher's Synopsis

Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.

Book information

ISBN: 9780750309790
Publisher: Taylor and Francis
Imprint: CRC Press
Pub date:
DEWEY: 537.622
DEWEY edition: 22
Language: English
Number of pages: 686
Weight: 1270g
Height: 234mm
Width: 156mm
Spine width: 37mm