Hardback (25 Jan 1996)
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This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.
| ISBN: | 9780750303477 |
| Publisher: | Taylor and Francis |
| Imprint: | CRC Press |
| Pub date: | 25 Jan 1996 |
| DEWEY: | 537.6221 |
| DEWEY edition: | 20 |
| Language: | English |
| Number of pages: | 795 |
| Weight: | -1g |
| Height: | 230mm |
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