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Microscopic Identification of Electronic Defects in Semiconductors

Microscopic Identification of Electronic Defects in Semiconductors Symposium Held April 15-18, 1985, San Francisco, California, U.S.A - Materials Research Society Symposia Proceedings

Book (01 Jan 1985)

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Book information

ISBN: 9780931837111
Publisher: Materials Research Society
Imprint: Materials Research Society
Pub date:
DEWEY: 621.38152
DEWEY edition: 19
Language: English
Number of pages: 604
Weight: -1g