Biometrics
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Published 20 Nov 2018
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Microlithography and Metrology in Micromachining 23-24 October, 1995, Austin, Texas - Proceedings / SPIE--the International Society for Optical Engineering
Paperback (30 Jun 2006)
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Book information
| ISBN: | 9780819420060 |
| Publisher: | SPIE |
| Imprint: | SPIE |
| Pub date: | 30 Jun 2006 |
| DEWEY: | 621.38152 |
| DEWEY edition: | 21 |
| Language: | English |
| Number of pages: | 246 |
| Weight: | 612g |
| Height: | 273mm |
| Width: | 216mm |
| Spine width: | 19mm |
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