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Microlithography and Metrology in Micromachining III

Microlithography and Metrology in Micromachining III 29-30 September, 1997, Austin, Texas - Proceedings / SPIE--the International Society for Optical Engineering

Paperback (02 Sep 1997)

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Book information

ISBN: 9780819426574
Publisher: SPIE
Imprint: SPIE
Pub date:
DEWEY: 621.38152
DEWEY edition: 21
Language: English
Number of pages: 134
Weight: -1g